Janusz Rajski: search on Z-Library

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1

Cell-Aware Test

Hapke, Friedrich, Redemund, Wilfried, Glowatz, Andreas, Rajski, Janusz, Reese, Michael, Hustava, Marek, Keim, Martin, Schloeffel, Juergen, Fast, Anja

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 3.19 MB

english, 2014

2

[IEEE 2010 19th Asian Test Symposium (ATS) - Shanghai, China (2010.12.1-2010.12.4)] 2010 19th IEEE Asian Test Symposium - Adaptive Low Shift Power Test Pattern Generator for Logic BIST

Lin, Xijiang, Rajski, Janusz

Year:

2010

Language:

english

File:

PDF, 252 KB

english, 2010

3

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Timing Defect Diagnosis in Presence of Crosstalk for Nanometer Technology

Mehta, Vishal, Marek-Sadowska, Malgorzata, Tsai, Kun-han, Rajski, Janusz

Year:

2006

Language:

english

File:

PDF, 11.89 MB

english, 2006

4

[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Defect Aware to Power Conscious Tests - The New DFT Landscape

Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2009

Language:

english

File:

PDF, 233 KB

english, 2009

5

Logic BIST with Capture-per-Clock Hybrid Test Points

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2018

Language:

english

File:

PDF, 2.50 MB

english, 2018

6

Scan Integrity Tests for EDT Compression

Cheng, Wu-Tung, Rajski, Grzegorz Mrugalski Janusz, Trawka, Maciej, Tyszer, Jerzy

Journal:

IEEE Design and Test

Year:

2020

Language:

english

File:

PDF, 4.41 MB

english, 2020

7

[IEEE 2020 IEEE International Test Conference in Asia (ITC-Asia) - Taipei, Taiwan (2020.9.23-2020.9.25)] 2020 IEEE International Test Conference in Asia (ITC-Asia) - Estimation of Test Data Volume for Scan Architectures with Different Numbers of Input Channels

Tsai, Fong-Jyun, Ye, Chong-Siao, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz, Zheng, Shi-Xuan

Year:

2020

File:

PDF, 450 KB

2020

8

[IEEE 2018 IEEE International Test Conference (ITC) - Phoenix, AZ, USA (2018.10.29-2018.11.1)] 2018 IEEE International Test Conference (ITC) - Deterministic Stellar BIST for In-System Automotive Test

Liu, Yingdi, Mukherjee, Nilanjan, Rajski, Janusz, Reddy, Sudhakar M., Tyszer, Jerzy

Year:

2018

Language:

english

File:

PDF, 37 KB

english, 2018

9

Isolation of Failing Scan Cells through Convolutional Test Response Compaction

Grzegorz Mrugalski, Janusz Rajski, Chen Wang, Artur Pogiel, Jerzy Tyszer

Journal:

Journal of Electronic Testing

Year:

2007

Language:

english

File:

PDF, 315 KB

english, 2007

10

Test Time Reduction in EDT Bandwidth Management for SoC Designs

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2013

Language:

english

File:

PDF, 585 KB

english, 2013

11

[IEEE 12th IEEE European Test Symposium - Freiburg, Germany (2007.05.20-2007.05.24)] 12th IEEE European Test Symposium (ETS'07) - Analyzing Volume Diagnosis Results with Statistical Learning for Yield Improvement

Tang, Huaxing, Manish, Sharma, Rajski, Janusz, Keim, Martin, Benware, Brady

Year:

2007

Language:

english

File:

PDF, 168 KB

english, 2007

12

[ACM Press the 32nd ACM/IEEE conference - San Francisco, California, United States (1995.06.12-1995.06.16)] Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 - On test set preservation of retimed circuits

El-Maleh, Aiman, Marchok, Thomas, Rajski, Janusz, Maly, Wojciech

Year:

1995

Language:

english

File:

PDF, 250 KB

english, 1995

13

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - At-Speed Testing with Timing Exceptions and Constraints-Case Studies

Goswami, Dhiraj, Tsai, Kun-han, Kassab, Mark, Kobayashi, Takeo, Rajski, Janusz, Swanson, Bruce, Walters, Darryl, Sato, Yasuo, Asaka, Toshiharu, Aikyo, Takashi

Year:

2006

Language:

english

File:

PDF, 235 KB

english, 2006

14

Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs

Brady Benware, Grzegorz Mrugalski, Artur Pogiel, Janusz Rajski, Jędrzej Solecki, Jerzy Tyszer

Journal:

Journal of Electronic Testing

Year:

2011

Language:

english

File:

PDF, 299 KB

english, 2011

15

[IEEE 2014 IEEE 32nd VLSI Test Symposium (VTS) - Napa, CA, USA (2014.04.13-2014.04.17)] 2014 IEEE 32nd VLSI Test Symposium (VTS) - Special session 8B — Panel: In-field testing of SoC devices: Which solutions by which players?

Abraham, Jacob A., Gu, Xinli, MacLaurin, Teresa, Rajski, Janusz, Ryan, Paul G., Gizopoulos, Dimitris, Reorda, Matteo Sonza

Year:

2014

Language:

english

File:

PDF, 152 KB

english, 2014

16

[IEEE 2009 14th IEEE European Test Symposium (ETS) - Sevilla, Spain (2009.05.25-2009.05.29)] 2009 14th IEEE European Test Symposium - We Have Got Compression, What Next?

Year:

2009

Language:

english

File:

PDF, 107 KB

english, 2009

17

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Low Test Data Volume Low Power At-Speed Delay Tests Using Clock-Gating

Moghaddam, Elham K., Rajski, Janusz, Reddy, Sudhakar M., Janicki, Jakub

Year:

2011

Language:

english

File:

PDF, 290 KB

english, 2011

18

[IEEE 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Istanbul, Turkey (2013.10.7-2013.10.9)] 2013 IFIP/IEEE 21st International Conference on Very Large Scale Integration (VLSI-SoC) - Embedded tutorials: Embedded tutorial 1: Cell-aware test-from gates to transistors

Rajski, Janusz, Potkonjak, Miodrag, Singh, Adit, Chatterjee, Abhijit, Navabi, Zain, Guthaus, Matthew, Goren, Sezer

Year:

2013

File:

PDF, 109 KB

2013

19

[IEEE 2010 IEEE International Test Conference (ITC) - Austin, TX, USA (2010.11.2-2010.11.4)] 2010 IEEE International Test Conference - Low capture power at-speed test in EDT environment

Moghaddam, Elham K., Rajski, Janusz, Reddy, Sudhakar. M., Lin, Xijiang, Mukherjee, Nilanjan, Kassab, Mark

Year:

2010

Language:

english

File:

PDF, 363 KB

english, 2010

20

[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Timing-Aware Multiple-Delay-Fault Diagnosis

Mehta, Vishal J., Marek-Sadowska, Malgorzata, Tsai, Kun-Han, Rajski, Janusz

Year:

2008

Language:

english

File:

PDF, 392 KB

english, 2008

21

[IEEE 2013 IEEE International Test Conference (ITC) - Anaheim, CA, USA (2013.09.6-2013.09.13)] 2013 IEEE International Test Conference (ITC) - On the generation of compact test sets

Kumar, Amit, Rajski, Janusz, Reddy, Sudhakar M., Wang, Chen

Year:

2013

Language:

english

File:

PDF, 163 KB

english, 2013

22

[IEEE 2011 IEEE 20th Asian Test Symposium (ATS) - New Delhi, India (2011.11.20-2011.11.23)] 2011 Asian Test Symposium - Fault Diagnosis in Memory BIST Environment with Non-march Tests

Mrugalski, Grzegorz, Pogiel, Artur, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Urbanek, Pawel

Year:

2011

File:

PDF, 1.07 MB

2011

23

[IEEE 2015 IEEE 24th Asian Test Symposium (ATS) - Mumbai, India (2015.11.22-2015.11.25)] 2015 IEEE 24th Asian Test Symposium (ATS) - TestExpress - New Time-Effective Scan-Based Deterministic Test Paradigm

Mrugalski, Grzegorz, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Wang, Chen

Year:

2015

Language:

english

File:

PDF, 1.10 MB

english, 2015

24

Autonomous Scan Patterns for Laser Voltage Imaging

Tyszer, Jerzy, Cheng, Wu-Tung, Milewski, Sylwester, Mrugalski, Grzegorz, Rajski, Janusz, Trawka, Maciej

Journal:

IEEE Transactions on Emerging Topics in Computing

Year:

2019

File:

PDF, 5.36 MB

2019

25

[IEEE 2020 IEEE European Test Symposium (ETS) - Tallinn, Estonia (2020.5.25-2020.5.29)] 2020 IEEE European Test Symposium (ETS) - Efficient Prognostication of Pattern Count with Different Input Compression Ratios

Tsai, Fong-Jyun, Ye, Chong-Siao, Huang, Yu, Lee, Kuen-Jong, Cheng, Wu-Tung, Reddy, Sudhakar M., Kassab, Mark, Rajski, Janusz

Year:

2020

File:

PDF, 277 KB

2020

26

EDT Bandwidth Management in SoC Designs

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2012

Language:

english

File:

PDF, 4.69 MB

english, 2012

27

[IEEE 2009 27th IEEE VLSI Test Symposium (VTS) - Santa Cruz, CA, USA (2009.05.3-2009.05.7)] 2009 27th IEEE VLSI Test Symposium - Highly X-Tolerant Selective Compaction of Test Responses

Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Czysz, Dariusz, Tyszer, Jerzy

Year:

2009

Language:

english

File:

PDF, 753 KB

english, 2009

28

[ACM Press the 35th annual conference - San Francisco, California, United States (1998.06.15-1998.06.19)] Proceedings of the 35th annual conference on Design automation conference - DAC '98 - A fast sequential learning technique for real circuits with application to enhancing ATPG performance

El-Maleh, Aiman, Kassab, Mark, Rajski, Janusz

Year:

1998

Language:

english

File:

PDF, 67 KB

english, 1998

29

[ACM Press the 44th annual conference - San Diego, California (2007.06.04-2007.06.08)] Proceedings of the 44th annual conference on Design automation - DAC '07 - New test data decompressor for low power applications

Mrugalski, Grzegorz, Rajski, Janusz, Czysz, Dariusz, Tyszer, Jerzy

Year:

2007

Language:

english

File:

PDF, 159 KB

english, 2007

30

[IEEE 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - San Francisco, CA, USA (2014.6.1-2014.6.5)] 2014 51st ACM/EDAC/IEEE Design Automation Conference (DAC) - On using implied values in EDT-based test compression

Gebala, Marcin, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 621 KB

english, 2014

31

Testing And Applications of Inverter-Free PLAs

Rajski, Janusz, Agarwal, Vinod

Journal:

IEEE Design & Test of Computers

Year:

1987

Language:

english

File:

PDF, 9.62 MB

english, 1987

32

[IEEE 2014 IEEE 23rd North Atlantic Test Workshop (NATW) - Johnson City, NY, USA (2014.5.14-2014.5.16)] 2014 IEEE 23rd North Atlantic Test Workshop - Test Compression Improvement with EDT Channel Sharing in SoC Designs

Huang, Yu, Kassab, Mark, Jahangiri, Jay, Rajski, Janusz, Cheng, Wu-Tung, Han, Dongkwan, Kim, Jihye, Chung, Kun Young

Year:

2014

Language:

english

File:

PDF, 658 KB

english, 2014

33

[IEEE 2014 19th IEEE European Test Symposium (ETS) - Paderborn, Germany (2014.5.26-2014.5.30)] 2014 19th IEEE European Test Symposium (ETS) - Using dynamic shift to reduce test data volume in high-compression designs

Lin, Xijiang, Kassab, Mark, Rajski, Janusz

Year:

2014

Language:

english

File:

PDF, 411 KB

english, 2014

34

[IEEE 2016 IEEE 25th Asian Test Symposium (ATS) - Hiroshima, Japan (2016.11.21-2016.11.24)] 2016 IEEE 25th Asian Test Symposium (ATS) - On Test Points Enhancing Hardware Security

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2016

Language:

english

File:

PDF, 302 KB

english, 2016

35

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Minimal area test points for deterministic patterns

Liu, Yingdi, Moghaddam, Elham, Mukherjee, Nilanjan, Reddy, Sudhakar M., Rajski, Janusz, Tyszer, Jerzy

Year:

2016

Language:

english

File:

PDF, 502 KB

english, 2016

36

Embedded Deterministic Test Points

Acero, Cesar, Feltham, Derek, Liu, Yingdi, Moghaddam, Elham, Mukherjee, Nilanjan, Patyra, Marek, Rajski, Janusz, Reddy, Sudhakar M., Tyszer, Jerzy, Zawada, Justyna

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2017

Language:

english

File:

PDF, 2.97 MB

english, 2017

37

[IEEE 2006 15th Asian Test Symposium - Fukuoka, Japan (2006.11.20-2006.11.20)] 2006 15th Asian Test Symposium - Timing-Aware ATPG for High Quality At-speed Testing of Small Delay Defects

Lin, Xijiang, Tsai, Kun-han, Wang, Chen, Kassab, Mark, Rajski, Janusz, Kobayashi, Takeo, Klingenberg, Randy, Sato, Yasuo, Hamada, Shuji, Aikyo, Takashi

Year:

2006

Language:

english

File:

PDF, 249 KB

english, 2006

38

[IEEE 2006 IEEE International Test Conference - Santa Clara, CA, USA (2006.10.22-2006.10.27)] 2006 IEEE International Test Conference - Preferred Fill: A Scalable Method to Reduce Capture Power for Scan Based Designs

Remersaro, Santiago, Lin, Xijiang, Zhang, Zhuo, Reddy, Sudhakar, Pomeranz, Irith, Rajski, Janusz

Year:

2006

Language:

english

File:

PDF, 11.73 MB

english, 2006

39

[IEEE 2014 IEEE 23rd Asian Test Symposium (ATS) - Hangzhou, China (2014.11.16-2014.11.19)] 2014 IEEE 23rd Asian Test Symposium - High-Speed Serial Embedded Deterministic Test for System-on-Chip Designs

Trawka, Maciej, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Pogiel, Artur, Rajski, Janusz, Janicki, Jakub, Tyszer, Jerzy

Year:

2014

Language:

english

File:

PDF, 1.19 MB

english, 2014

40

[IEEE 2008 23rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFTVS) - Cambridge, MA, USA (2008.10.1-2008.10.3)] 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems - ATPG Heuristics Dependant Observation Point Insertion for Enhanced Compaction and Data Volume Reduction

Remersaro, Santiago, Rajski, Janusz, Rinderknecht, Thomas, Reddy, Sudhakar M., Pomeranz, Irith

Year:

2008

Language:

english

File:

PDF, 344 KB

english, 2008

41

[IEEE 2015 28th IEEE International System-on-Chip Conference (SOCC) - Beijing, China (2015.9.8-2015.9.11)] 2015 28th IEEE International System-on-Chip Conference (SOCC) - Session T1B: Tutorial: SoC testing

Huang, Yu, Rajski, Janusz

Year:

2015

Language:

english

File:

PDF, 182 KB

english, 2015

42

[IEEE 2016 IEEE International Test Conference (ITC) - Fort Worth, TX, USA (2016.11.15-2016.11.17)] 2016 IEEE International Test Conference (ITC) - Test point insertion in hybrid test compression/LBIST architectures

Moghaddam, Elham, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy, Zawada, Justyna

Year:

2016

Language:

english

File:

PDF, 571 KB

english, 2016

43

[IEEE 2017 IEEE International Test Conference (ITC) - Fort Worth, TX (2017.10.31-2017.11.2)] 2017 IEEE International Test Conference (ITC) - Full-scan LBIST with capture-per-cycle hybrid test points

Milewski, Sylwester, Mukherjee, Nilanjan, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy, Zawada, Justyna

Year:

2017

Language:

english

File:

PDF, 1.41 MB

english, 2017

44

Erratum to “Test Time Reduction in EDT Bandwidth Management for SoC Designs” [Nov 13 1776-1786]

Janicki, Jakub, Kassab, Mark, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Journal:

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Year:

2014

Language:

english

File:

PDF, 532 KB

english, 2014

45

[IEEE 2016 IEEE European Test Symposium (ETS) - Amsterdam, Netherlands (2016.5.23-2016.5.27)] 2016 21th IEEE European Test Symposium (ETS) - Transistor stuck-on fault detection tests for digital CMOS circuits

Lin, Xijiang, Reddy, Sudhakar M., Rajski, Janusz

Year:

2016

Language:

english

File:

PDF, 242 KB

english, 2016

46

[IEEE 2019 IEEE International Test Conference (ITC) - Washington, DC, USA (2019.11.9-2019.11.15)] 2019 IEEE International Test Conference (ITC) - Test Time and Area Optimized BrST Scheme for Automotive ICs

Mukherjee, Nilanjan, Tille, Daniel, Sapati, Mahendar, Liu, Yingdi, Mayer, Jeffrey, Milewski, Sylwester, Moghaddam, Elham, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Year:

2019

Language:

english

File:

PDF, 10.98 MB

english, 2019

47

[IEEE 2011 16th IEEE European Test Symposium (ETS) - Trondheim, Norway (2011.05.23-2011.05.27)] 2011 Sixteenth IEEE European Test Symposium - Reduced ATE Interface for High Test Data Compression

Czysz, Dariusz, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Rajski, Janusz, Tyszer, Jerzy

Year:

2011

Language:

english

File:

PDF, 564 KB

english, 2011

48

Low-Power Programmable PRPG With Test Compression Capabilities

Filipek, Michal, Mrugalski, Grzegorz, Mukherjee, Nilanjan, Nadeau-Dostie, Benoit, Rajski, Janusz, Solecki, Jedrzej, Tyszer, Jerzy

Journal:

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

Year:

2015

Language:

english

File:

PDF, 4.42 MB

english, 2015

49

[IEEE 2012 IEEE 30th VLSI Test Symposium (VTS) - Maui, HI, USA (2012.04.23-2012.04.25)] 2012 IEEE 30th VLSI Test Symposium (VTS) - Test generator with preselected toggling for low power built-in self-test

Rajski, Janusz, Tyszer, Jerzy, Mrugalski, Grzegorz, Nadeau-Dostie, Benoit

Year:

2012

Language:

english

File:

PDF, 720 KB

english, 2012

50

[ACM Press the 2005 conference - Shanghai, China (2005.01.18-2005.01.21)] Proceedings of the 2005 conference on Asia South Pacific design automation - ASP-DAC '05 - Propagation delay fault

Lin, Xijiang, Rajski, Janusz

Year:

2005

Language:

english

File:

PDF, 93 KB

english, 2005

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